ATPG 4 MI-R A-Series

atpg  Chip-level ATPG in a hierarchical DFT methodology The move to hierarchical DFT has led to dramatic improvements in all aspects of DFT Some of Typically, the staggered scheme produces small test sets but needs long ATPG runtime, whereas the one-hot scheme takes short ATPG runtime but yields large test

Automatic Test Pattern Generation based on Boolean Satisfiability is a robust alternative to classical structural ATPG Due to the powerful Designs using ATPG scan patterns require multiple sets of patterns to target known fault models like stuck-at, transition, path delay, small

ABSTRACT An ATPG technique is proposed that reduces heat dissipationduring testing of sequential circuits that have full-scan The objectiveis 18 References · Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs · A Framework of High-quality Transition Fault